GB/T 42676-2023
半导体单晶晶体质量的测试 X射线衍射法
Test method for crystalline quality of semiconductive single crystal—X-ray diffraction method
- 实施日期
- 2024-03-01
- ICS 分类
- 77.040
组合使用关键词、标准类型、状态与 ICS 分类,快速定位所需国家标准。
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GB/T 42676-2023
Test method for crystalline quality of semiconductive single crystal—X-ray diffraction method
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