GB/T 10593.5-2025
电工电子产品环境参数测量方法 第5部分:腐蚀性气体
Method of the measuring environmental paramenters for electric and electronic products—Part 5: Corrosive gas
- 实施日期
- 2026-02-01
- ICS 分类
- 19.040
组合使用关键词、标准类型、状态与 ICS 分类,快速定位所需国家标准。
找到 70,494 条
GB/T 10593.5-2025
Method of the measuring environmental paramenters for electric and electronic products—Part 5: Corrosive gas
GB/T 18495-2025
Resistance welding equipment—Transformers—Integrated transformers for welding guns
GB/T 41207-2025
Information and documentation—Management systems for records—Guidelines for implementation
GB/T 34333-2025
Refractories—Chemical analysis by inductively coupled plasma atomic emission spectrometry(ICP-AES)
GB/T 34219-2025
Refractory products—Determination of tensile strength at room temperature
GB/T 14257-2025
Bar code for commodity—Placement requirements for bar code symbol
GB/T 45903.3-2025
Ships and marine technology—Pilot ladders—Part 3:Attachments and associated equipment
GB/T 45903.2-2025
Ships and marine technology—Pilot ladders—Part 2: Maintenance, use, survey, and inspection
GB/T 10357.7-2025
Test of mechanical properties of furniture—Part 7:Stability of tables
GB/T 10593.4-2025
Method of the measuring environmental parameters for electric and electronic products—Part 4: Condensation
GB/T 20077-2025
One-trip pallet
GB/T 13790-2025
Cold rolled low carbon steel sheet and strip for vitreous enamelling
GB/T 32647-2025
Specification for flat panel display glass substrates
GB/T 45505.2-2025
Test method of flat panel display glass substrate—Part 2: Surface properties
GB/T 45505.5-2025
Test method of flat panel display glass substrate—Part 5: Photoelectric performance
GB/T 45505.3-2025
Test method of flat panel display glass substrate—Part 3:Thermal properties
GB/T 45505.1-2025
Test method of flat panel display glass substrate—Part 1: Appearance and geometric dimensions
GB/T 28859-2025
Epoxy powder encapsulation material for electronic packaging
GB/T 30868-2025
Test method for micropipe density of monocrystalline silicon carbide
GB/T 32278-2025
Test method for thickness and fltaness of monocrystalline silicon carbide wafers