GB/T 3859.3-2013
半导体变流器 通用要求和电网换相变流器 第1-3部分:变压器和电抗器
Semiconductor converters - General requirements and line commutated converters - Part 1-3: Transformers and reactors
- 实施日期
- 2013-12-02
- ICS 分类
- 29.200
组合使用关键词、标准类型、状态与 ICS 分类,快速定位所需国家标准。
找到 4,341 条
GB/T 3859.3-2013
Semiconductor converters - General requirements and line commutated converters - Part 1-3: Transformers and reactors
GB/T 3859.2-2013
Semiconductor converters - General requirements and line commutated converters - Part 1-2: Application guide
GB/T 3859.1-2013
Semiconductor converters - General requirements and line commutated Converters - Part 1-1: Specification of basic requirements
GB/T 29627.1-2013
Aramid pressboard for electrical purposes - Part 1: Definitions, designations and general requirements
GB/T 19264.3-2013
Pressboard and presspaper for electrical purposes - Part 3: Requirements for pressboard
GB/T 14598.127-2013
Measuring relays and protection equipment - Part 127: Functional requirements for over/under voltage protection
GB/T 21419-2013
Safety of transformers,reactors,power supply units and combinations thereof-EMC requirements
GB/T 3217-2013
Permanent magnet (magnetically hard) materials - Methods of measurement of magnetic properties
GB/T 29628-2013
Guides for methods of measurement of the magnetic properties of permanent(magnetically hard)materials by pulsed field magnetometry
GB/T 29627.2-2013
Aramid pressboard for electrical purposes - Part 2: Methods of test
GB/T 20629.2-2013
Non-cellulosic paper for electrical purposes - Part 2:Methods of test
GB/T 19264.2-2013
Pressboard and presspaper for electrical purposes - Part 2: Methods of test
GB/T 13422-2013
Semiconductor converters - Electrical test methods
GB/T 14711-2013
General requirements for safety of small and medium size rotating electrical machines
GB/T 29508-2013
300mm monocrystalline silicon as cut slices and grinded slices
GB/T 29506-2013
300mm polished monocrystalline silicon wafers
GB/T 29504-2013
300mm monocrystalline silicon
GB/T 29507-2013
Test method for measuring flatness, thickness and total thickness variation on silicon wafers by automated non-contact scanning
GB/T 29505-2013
Test method for measuring surface roughness on planar surfaces of silicon wafer
GB/Z 25320.2-2013
Power systems management and associated information exchange - Data and communications security - Part 2: Glossary of terms